What Is the Advanced Instrumentation Monitor (AIM)?
Data Acquisition System for
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The MCC instrumentation monitoring system is engineered to integrate hardware and software into a complete data acquisition and analysis system. AIM is a state-of-the-art tool that facilitates research, process development, scale-up, and production of tablets and capsules. It is Windows NT based and provides continuous batch recordings and process optimization for all instrumented equipment. The system is modular and is contained in a mobile enclosure or laptop computer that can be moved between different types of instrumented equipment. Each system can be custom tailored to match customer specific needs.
The AIM system is designed modularly to monitor tablet presses, mixer-granulators, encapsulators, tablet coaters, roller compactors, mills, extruders, kettles, fluid bed granulators, and conventional dryers. Each system is built to meet customer specific needs. The AIM System Provides a Vast Flexibility to Monitor:
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The TABLET PRESS MODULE (TPM) can monitor upper and lower compression, upper and lower pre-compression, ejection, and take-off forces. TPM provides real time force meters, per punch statistics, streamline compactibility profiles, dissolution and disintegration cross-correlations, raw materials evaluation, quality control, and press troubleshooting. TPM reports provide punch forces and contact and dwell times.
The AIM-TPM System provides a Comprehensive Analysis of:
Upper/Lower Precompression
Upper/Lower Main Compression
Ejection
Take-Off Force
Real Time Force Meters
Per Punch Statistics
Dwell Time
Contact Time
Area Under Curve
Rate of Force Application
Rate of Force Decline
Work of Compaction
The MIXER-GRANULATOR MODULE (MGM) monitors torque on the main shaft and/or the main motor power consumption. MGM provides end point determination, scale-up, torque and power consumption profiles, blade or blade tip speed, product or bowl temperature, digital filtering and signal derivatives, real time frequency distribution, batch-to-batch variability control, product fingerprinting and repeatability.
The ENCAPSULATOR MODULE (ECM) monitors tamping force, ejection force, cycle/speed, and pin and block displacement. The ECM provides printed reports for individual tamping pins, bar histograms of pin performance, extensive and easy to use graphics, XY cross-plots of capsule properties and peak statistics.
The TABLET COATING MODULE (TCM) monitors independent variables such as coating spray rate, inlet air temperature, atomizing air pressure, inlet air humidity, spray temperature, spray concentration, fan rotational speed, drum rotational speed, coating drum drive torque, drum power consumption, and fan power consumption. TCM can also monitor dependent variables such as outlet air temperature, outlet air flow rate, coating suspension temperature, tablet surface temperature, outlet air temperature, and outlet air humidity. The TCM gives the user the ability to cross-correlate coating quality with all process variables.